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  • Keithley PCT

    Дополнительная информация


    Конфигурируемый характериограф Keithley PCT это готовая система для тестирования полупроводниковых устройств высокой мощности, включающая в себя высокого качества измерительные приборы, кабели, тестовые оснастки и ПО. Для заказа доступно 7 готовых конфигураций, каждая из которых обеспечивает построение графиков ВАХ и ВФХ в режиме реального времени для быстрого измерения основных параметров устройства, такие как напряжение пробоя и полный параметрический расчет характеристик устройства.

    Краткие характеристики:

    • Конфигурируемые диапазоны уровня мощности:
      • От 200 В до 3 кВ
      • От 1 фА до 100 А
    • Широкий динамический даиапзон:
      • От мкВ до 3 кВ
      • От фА до 100 А
    • Метод измерения вольт-фарадной характеристики:
      • ±400 В многочастотное измерение вольт-фарадных характеристик
      • 20 В низкочастотный метод измерения вольт-фарадной характеристики
    • Измерение вольт-амперной характеристики на постоянном токе и импульсном до 50 мкс
    • Оба канала высокого напряжения и высокого тока имеют прецизионный АЦП разрядностью 24 бита (18 бит в режиме высокой скорости дискретизации (1 мкс))

     

    Применение:

    • Снятие характеристик мощных полупроводниковых устройств
    • Снятие характеристик GaN и SiC, LDMOS и др устройств
    • Проверка надежности мощных устройств
    • Входной контроль и квалификационные испытания



     
    ACS Basic Edition Software quickly captures output characteristics of an IGBT device.

    The Keithley Parametric Curve Trace configurations are complete characterization tools that include all of the key elements necessary for power device characterization. The measurement channels consist of high quality Keithley SourceMeter (trademark) and/or Semiconductor Characterization instruments. The dynamic range and accuracy of these instruments is orders of magnitude beyond what a traditional curve tracer could offer. To achieve this performance, Keithley has developed a set of precision cables to connect the instruments to the test fixture. For the high voltage channel, custom triax cables provide a guarded pathway that enables fast settling and very low currents, even at the full 3kV. For the high current channel, special low inductance cables provide fast rise time pulses to minimize device self heating effects. Equally critical is a safe, efficient test fixture. The 8010 provides an interlocked, shielded environment that allows for both low current, high voltage testing and high current, low voltage testing. Included with the test fixture are the same high performance connectors that mate with the precision cables. Also included are protection circuits to prevent the high voltage channel from destroying the base/gate channel in the event of a device fault.

    Model 2600-PCT-4

    Model 4200-SCS 

    Flexible, safe test fixture for 3kV and 100A

    8010 Test Fixture

    High current, low inductance cables

    High voltage, low noise triaxial cables

    Semiconductor Parametric Test Software for Component and Discrete Devices
    ACS Basic Edition software is specifically tuned to take advantage of the high performance capabilities of the Keithley instrumentation and includes several sample libraries for performing common high power device tests. Unlike other systems, the software allows the user almost unlimited flexibility in configuring all of the measurement channels to create tests far beyond what a traditional curve tracer could achieve.


    Multi test mode allows multiple tests to be performed on a device.

    Trace mode supports interactive testing of a device.

    Configuration Selector Guide
    Model 1 Collector/ Drain Supply 2 Step Generator
    Base/Gate Supply
    Auxiliary Supply
    High Voltage Mode High Current Mode
    Low Power 2600-PCT-1 200 V/10 A 200 V/10 A 200 V/10 A N/A
    High Current 2600-PCT-2 200 V/10 A 40 V/50 A 200 V/10 A 200 V/10 A
    4200-PCT-2 plus C-V 200 V/1 A 40 V/50 A 200 V/1 A 200 V/1 A
    High Voltage 2600-PCT-3 3 kV/120 mA 200 V/10 A 200 V/10 A 200 V/10 A
    4200-PCT-3 plus C-V 3 kV/120 mA 200 V/1 A 200 V/1 A 200 V/1 A
    High Current and
    High Voltage
    2600-PCT-4 3 kV/120 mA 40 V/50 A 200 V/10 A 200 V/10 A
    4200-PCT-4 plus C-V 3 kV/120 mA 40 V/50 A 200 V/1 A 200 V/1 A
    1. Contact your Keithley field applications engineer for custom configurations
    2. Add a Model 2651A to increase High Current Mode to either 50A or 100A.
    Typical Power Transistor Parameters
    Parameter symbol Test Method 1 Maximum range Typical best resolution Typical accuracy
    Breakdown Voltage Bvdss, Bvceo Id–Vd or Id (pulse) ±3000 V 2 100 µV, 10 fA 0 .05% rdg + 0 .05% rng
    On-State Current (DC) Vdson, Vcesat, Vf Id–Vd ±20 A 4  , Optional: ±40 A 4 100 nA, 1 µV 0 .05% rdg + 0 .05% rng
    On-State Current (Pulse) Vdson, Vcesat, Vf Id–Vd ±50 A 4, Optional: ±100 A 4 100 µA, 1 µV 0 .05% rdg + 0 .05% rng
    Drain/Collector  Leakage  Current Idss, Ir/Icbo, Iceo Id–Vd ±20 mA @ 3000 2, 5 10 fA, 1 µV 0 .2% rdg + 1% rng
    Gate/Base Leakage Current Igss, Ib Ig–Vg ±1 A or, ±10 A Pulsed 3 10 fA, 1 µV 0 .2% rdg + 1% rng
    On-State Threshold Voltage or Cutoff Voltage          
    Vth, Vf, Vbeon, Vcesat Id–Vg ±200 V 3 10 fA, 1 µV 0 .2% rdg + 0 .5% rng
    Forward Transfer Admittance or Forward Transconductance
    |yfs| Gfs, Hfe, gain Vd–Id @ Vds 1 ms ~ 1000 s 6 1 pA, 1 µV 1%
    On-State  Resistance RDS(on), Vcesat Vd–Vg @ Id <100 span="" class="font5">Ω 7 10 µ, 1 µV 1%
    Input Capacitance Ciss C–V 100 kHz 10 nF 8  ±200 V 10 fF, 10 µV Better than 1% at C<10 nf="" td="">
    Output Capacitance Coss C–V 100 kHz 10 nF 8  ±200 V 10 fF, 10 µV Better than 1% at C<10 nf="" td="">
    Reverse Transfer Capacitance Crss C–V 100 kHz 10 nF 8  ±200 V 10 fF, 10 µV Better than 1% at C<10 nf="" td="">
    1. Test method used for extracting the parameter. Only typical MOSFET listed, but similar method for other devices.
    2. Model 2657A High Power System SourceMeter® SMU Instrument.
    3. Model 2636A SourceMeter SMU Instrument or Model 4210-SMU.
    4. Model 2651A High Power System SourceMeter SMU Instrument or optional dual Model 2651A High Power System SourceMeter SMU Instruments.
    5. Maximum 20mA at 3000V, 120mA at 1500V.
    6. Typical extracted capability (Example: 1mA/1V ~ 1A/1mV).
    7. Typical extracted capability (Example: 1mV/10A).
    8. Max. ±200VDC (±400VDC differential) bias with 4210-CVU and 4200-CVU-PWR.
    Summary of Typical Tests
    Device  Leakage  Breakdown  Gain  On-State
    Bipolar
    Junction
    Transistor
    IEBO, IECO,
    IEVEB, ICVCB
    BVCBO, BVCEI,
    BVCEO, BVCEV,
    BVEBO, BVECO
    HFE IBCO, IBEO, IBICVBE, IBVBE, ICBO, ICEV, ICVCE_BiasIB, ICVCE_BiasVB, ICVCE_StepIB, ICVCE_StepVB, VBCO, VCE
    MOSFET IDL,
    IDS_ISD,
    IGL, ISL
    BVDSS, BVDSV,
    BVGDO, BVGDS,
    BVGSO
    GM IDVD_BiasVG, IDVD_StepVG, IDVG_BiasVD, IDVG_StepVD, IDVG_StepVSUB, IGVG, VTCI, VTEXT, VTEXT_IISQ
    Diode IRDVRD VBRIRD NA DYNAMICZ, IFDVFD, VFDIFD, VRDIRD
    Resistor NA NA NA IV
    Capacitor IV NA
    Formulator Function Summary
    Type
    Math  ABS, AVG, DELTA, DIFF, EXP, LN, LOG, LOG10, SQRT
    Parametric
    Extractions
    GMMAX, RES, RES_4WIRE, RES_AVG, SS, SSVTCI, TTF_DID_LGT, TTF_LGDID_T, TTF_DID_T, TTF_LGDID_LGT, VTCI, VTLINGM, VTSATGM
    Fitting EXPFIT, EXPFITA, EXPFITB, LINFIT, LINFITSLP,
    LINFITXINT, LINFITYINT, REGFIT, REGFITSLP, REGFITXINT, REGFITYINT, REGFIT_LGX_LGY, REGFIT_ LGX_Y, REGFIT_X_LGY, TANFIT, TANFITSLP,TANFITXINT, TANFITYINT
    Manipulation AT, FINDD, FINDLIN, FINDU, FIRSTPOS, JOIN, LASTPOS, MAX, MAXPOS, MIN, MINPOX, POW, SMOOTH

    Ordering Information
    2600-PCT-1  Low Power
    2600-PCT-2  High Current
    2600-PCT-3  High Voltage
    2600-PCT-4  High Voltage and Current
    4200-PCT-2  High Current + C-V
    4200-PCT-3  High Voltage + C-V
    4200-PCT-4  High Voltage and Current + C-V
    Accessories Supplied
    ACS BAS IC Component
    Test Software
    8010 High Power Device Test Fixture  (includes 8010-CTB, 8010-DTB, and 8010-DTB-220)
    KUSB-488B USB to GPIB Adapter (Series 2600B configurations only)
    All cables and adapters
    Sample parts
    4200-CVU-PWR  (4200-SCS configurations only)
    Note: Computer and monitor not included with 2600-PCT-x configurations
    Accessories Available
    2651A High Power System SourceMeter (adds 50A to any system, max 100A)
    2657A High Power System SourceMeter (adds 3kV to any system, max of one unit per system)
    8010-CTB Customizable Test Board
    8010-DTB Device Test Board with TO-247 socket 
    8010-DTB-220 Device Test Board with TO-220 socket 
    70161-MSA Keyboard/Monitor Arm for K420 and K475 Carts
    HV-CA-554-1 HV Triax Cables (three required for 2657A)
    K475 Workstation Tower Mobile cart for all PCT configurations
    K420 Workbench Cart Mobile cart for smaller PCT configurations

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